Subject description - XP13SSD

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XP13SSD Special Methods of Devices Quality Evaluation
Roles:S Extent of teaching:2P+2L
Department:13113 Language of teaching:CS
Guarantors:Papež V. Completion:Z,ZK
Lecturers:Papež V. Credits:4
Tutors:Papež V. Semester:Z

Anotation:

The evaluation of the principal values determining the quality of the passive and active devices. Measuring methods, their evaluation , identification of systematic faults. The description of the tested device, two ports parameters of the device. Matching of the device to the measuring circuit. The noise of the electronic circuits, optimal noise and power matching. Non-linearity of the "linear" circuits, intermodulation distortion, measuring of the non-linearity and intermodulations.

Study targets:

A student are well-educated of the principal methods of evaluating of the quality of the passive and active devices

Content:

The evaluation of the principal values determining the quality of the passive and active devices. Measuring methods, their evaluation , identification of systematic faults. The description of the tested device, two ports parameters of the device. Matching of the device to the measuring circuit. The noise of the electronic circuits, optimal noise and power matching. Non-linearity of the "linear" circuits, intermodulation distortion, measuring of the non-linearity and intermodulations.

Course outlines:

1. Measuring methods, their evaluation , identification of systematic faults.
2. The description of the tested device, two ports parameters of the device.
3. Matching of the device to the measuring circuit.
4. The noise of the electronic circuits,
5. Optimal noise and power matching.
6. Non-linearity of the "linear" circuits,
7. Intermodulation distortion,
8. Measuring of the non-linearity and intermodulations.

Exercises outline:

1. Safety in laboratories. Instruction about lab. measurements - group 1.
2. Nonlinearity and noise of resistors.
3. Matched power amplifier
4. HF matching circuits.
5. Nose figure measurement
6. Matching in noise figure measuring circuits.
7. Evaluation of lab. reports.
8. Instruction about lab. measurements - group 2.
9. Intermodulating distortion measurement.
10. Measurement of non-linearity of linear devices.
11. Transformers and filters with distributed parameters.
12. Active two-ports, scattering parameters.
13. The stability of measuring circuits.
14. Evaluation of lab. reports. A credit.

Literature:

[1] Detlefsen, J. ; Siart, U.: Grundlagen der Hochfrequenztechnik. München: Oldenbourg, 2012
[2] Zinke, Brunswig, Lehrbuch der Hochfrequenztechnik, 3. Auflage, Springer-Verlag, Berlin 1986

Requirements:

The credit reguirements: seminar presentation, one protokol of labs and the student must obtain minimally 50 % of avaliable points in the tests.

Webpage:

/education/bk/predmety/11/85/p11850504.html

Keywords:

elektronic devices, quality of electronic devices

Subject is included into these academic programs:

Program Branch Role Recommended semester
DOKP Common courses S
DOKK Common courses S


Page updated 19.8.2022 17:50:24, semester: Z/2024-5, Z,L/2022-3, L/2021-2, Send comments about the content to the Administrators of the Academic Programs Proposal and Realization: I. Halaška (K336), J. Novák (K336)