Persons

Ing. Mgr. Neda Neykova, Ph.D.

All publications

Charge trapping and luminescence of the mixed size CsPbBr3 particles grown in one batch

  • Authors: Buryi, M., Babin, V., Děcká, K., Ridzoňová, K., Ing. Mgr. Neda Neykova, Ph.D., Hájek, F., Velkov, Z., Remeš, Z., Tomala, R., Socha, P., Bartosiewicz, K., Hostinský, T., Mošner, P., Yamamoto, T., Ma, Ch.-G., Brik, M.G.
  • Publication: Optical Materials. 2024, 151 115279-1-115279-12. ISSN 0925-3467.
  • Year: 2024
  • DOI: 10.1016/j.optmat.2024.115279
  • Link: https://doi.org/10.1016/j.optmat.2024.115279
  • Department: Department of Electrotechnology
  • Annotation:
    Cesium lead bromide (CsPbBr3, CPB) powder formed by micro-, nanocrystals (MC, NC) and quantum dots (QD) was synthesized as free-standing and polystyrene covered. Luminescence was multicomponent, in general, ranging from below 1.9 eV up to about 2.6 eV. The ultrafast decay kinetics exhibited strong decay time component with the value of 260 ps. Electron paramagnetic resonance (EPR) revealed surface defects like O 2 and some spin transitions most likely originating from some complex defect, supposedly F-Vk(H) dimer center under the constant ultraviolet (UV) light irradiation at the temperature T = 10 K. The thermal release of the electrons from the O 2 center was correlated with the 117 K thermally stimulated luminescence (TSL) peak. Coating with polystyrene resulted in the about doubly increased decay time of luminescence.

Optimizing stability of wet chemistry oxide passivation of Si (111) and Si (100)

  • DOI: 10.59957/jctm.v59.i2.2024.15
  • Link: https://doi.org/10.59957/jctm.v59.i2.2024.15
  • Department: Department of Electrotechnology
  • Annotation:
    Numerous parameters are regulated in the wet chemical oxidation process for TOPCon/POLO solar cell technology to improve silicon oxide passivation (SiO2). Understanding the electronic properties, particularly the lifetime of the carriers and their thickness, requires knowledge of the properties of the surface of crystalline silicon (c-Si), which is subjected to native oxide etching followed by wet chemical oxidation, such as nitric acid or hot water oxidation and various hydrogenation methods. This is tracked with lifetime measurement equipment, and spectral ellipsometry is used to measure the thickness of the oxide layer by using the single sided polished wafers with surface orientation (1 1 1). In addition to the actual values, their time stability is also tracked. Before the hydrogenation step was introduced, the lifetime of the samples was in the order of approximately 0.001 ms, which is less than the bulk lifetime. With the hydrogenation , lifetime increased by more than order of magnitude for relatively long time with no difference between (1 1 1) and (1 0 0) wafers indicating that hydrogenation of the Si/SiO2 interface is performed.

Correlating light-induced deep defects and phase segregation in mixed-halide perovskites

  • DOI: 10.1039/D2TA03538C
  • Link: https://doi.org/10.1039/D2TA03538C
  • Department: Department of Electrotechnology
  • Annotation:
    Mixed-halide perovskites are highly promising materials for tandem solar cells. The phenomenon of phase segregation, however hinders their application. Here, we combine Fourier-Transform photocurrent spectroscopy with photoluminescence and current density–voltage (J–V) measurements to study the effect of light soaking on such materials and devices. At first, we observe a gradual formation of an I-rich phase, which correlates with an increase in deep defect level concentration. We attribute these deep defects to charged iodide interstitials and associate phase segregation with iodide migration through interstitial positions. Upon further light soaking, the second less I-rich phase forms, while the deep level concentration simultaneously decreases. An empirical model describing the phase segregation mechanism is proposed to rationalize these observations. Further, we point to an important role of grain size in determining the degree and terminal phase of segregation.

Free-Standing ZnO:Mo Nanorods Exposed to Hydrogen or Oxygen Plasma: Influence on the Intrinsic and Extrinsic Defect States

  • Authors: Buryi, M., Remeš, Z., Babin, V., Chertopalov, S., Děcká, K., Dominec, F., Mičová, J., Ing. Mgr. Neda Neykova, Ph.D.,
  • Publication: Materials. 2022, 2022(15(6)), 2261-1-2261-18. ISSN 1996-1944.
  • Year: 2022
  • DOI: 10.3390/ma15062261
  • Link: https://doi.org/10.3390/ma15062261
  • Department: Department of Electrotechnology
  • Annotation:
    Cationic doping of ZnO nanorods has gained increased interest as it can lead to the production of materials with improved luminescent properties, electrical conductivity and stability. We report on various Mo-doped ZnO powders of nanorods synthesized by the hydrothermal growth method. Further annealing or/and cold hydrogen or oxygen plasma modification was applied. The atomic structure of the as-grown and plasma-modified rods was characterized by X-ray diffraction. To identify any possible changes in morphology, scanning electron microscopy was used. Paramagnetic point defects were investigated by electron paramagnetic resonance. In particular, two new types of defects were initiated by the plasma treatment. Their appearance was explained, and corresponding mechanisms were proposed. The changes in the luminescence and scintillation properties were characterized by photo- and radioluminescence, respectively. Charge trapping phenomena were studied by thermally stimulated luminescence. Cold plasma treatment influenced the luminescence properties of ZnO:Mo structures. The contact with hydrogen lead to an approximately threefold increase in intensity of the ultraviolet exciton-related band peaking at ~3.24 eV, whereas the red band attributed to zinc vacancies (~1.97 eV) was suppressed compared to the as-grown samples. The exciton- and defect-related emission subsided after the treatment in oxygen plasma.

Responsible person Ing. Mgr. Radovan Suk